Advances in OptoElectronics / 2013 / Article / Fig 4

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Figure 4

Correlation of  burn-in and life test aging. The burn-in and subsequent life test degradation rates are correlated. The degradation rate is decreased over time. The solid and dash lines indicate the linear regression and 95% confidence intervals, respectively.

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