Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

<table>Correlation of  burn-in and life test aging. The burn-in and subsequent life test degradation rates are correlated. The degradation rate is decreased over time. The solid and dash lines indicate the linear regression and 95% confidence intervals, respectively.</table>

Advances in OptoElectronics

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Figure 4: Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance? 

Figure 4 | Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance? 