Advances in OptoElectronics / 2013 / Article / Tab 1

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Table 1

Sub-linear model fitting extrapolation of burn-in curves for cases A and B.

Case ACase B

Fitting exponent
Fitting-correlation factor
th stabilizationAt 12 hrAt 24 hr
square0.9670.874
Sample size45

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