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Advances in OptoElectronics
Volume 2015 (2015), Article ID 472852, 4 pages
http://dx.doi.org/10.1155/2015/472852
Research Article

Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer

School of Engineering, Jiangxi Agricultural University, Nanchang 330045, China

Received 21 August 2015; Revised 14 September 2015; Accepted 20 September 2015

Academic Editor: Michele Norgia

Copyright © 2015 Rilong Liu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.