Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer

<div class="floats-full-page floats-full-page-figure"><h2>Figure 2</h2><div class="floats-full-page-caption"><div>Influence of reflectance change of beam splitter on modulation depth.</div></div><div class="floats-full-page-content"><table class="figure-group"><tr class="fig-image"><td><object data="https://static-01.hindawi.com/articles/aoe/volume-2015/472852/figures/472852.fig.002.svgz" name="472852.fig.002" type="image/svg+xml"></object></td></tr></table></div></div>

Figure 2 | Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer

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Figure 2: Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer

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Figure 2

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<p>Advances in OptoElectronics publishes papers on the theory, design, fabrication, and applications of devices and components that convert light into an electrical current or, conversely, an electric current into light.</p>


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