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ElectroComponent Science and Technology
Volume 4 (1977), Issue 1, Pages 9-17
http://dx.doi.org/10.1155/APEC.4.9

Grain Size Dependence of the Gauge Factor of Thin Metallic Films

Université de Nancy I, Laboratoire d'Electronique, Case officielle n° 140, Nancy–Cedex 54 037, France

Received 10 May 1976; Accepted 5 April 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The combined effects of grain boundary, external surface and background scattering (Mayadas and Shatzkes model) are considered. Theoretical expressions of the transverse and longitudinal strain coefficient of resistance of monocrystalline and polycrystalline films are calculated. These general formulae agree with those previously proposed for infinitely thick polycrystalline films.