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ElectroComponent Science and Technology
Volume 4, Issue 1, Pages 9-17
http://dx.doi.org/10.1155/APEC.4.9

Grain Size Dependence of the Gauge Factor of Thin Metallic Films

Université de Nancy I, Laboratoire d'Electronique, Case officielle n° 140, Nancy–Cedex 54 037, France

Received 10 May 1976; Accepted 5 April 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [15 citations]

The following is the list of published articles that have cited the current article.

  • C.R. Tellier, and A.J. Tosser, “An extension of the Cottey conduction model,” Thin Solid Films, vol. 52, no. 1, pp. 53–61, 1978. View at Publisher · View at Google Scholar
  • F. Warkusz, “Size effect in the longitudinal and transverse strain coefficients of resistance in metal films,” Thin Solid Films, vol. 55, no. 2, pp. 275–281, 1978. View at Publisher · View at Google Scholar
  • Aj Tosser, and Cr Tellier, “Approximate Strain Coefficients Of Metallic-Films Deduced From An Effective Fuchs-Sondheimer Conduction Model And From An Effective Relaxation-Time Method,” Thin Solid Films, vol. 57, no. 1, pp. 163–168, 1979. View at Publisher · View at Google Scholar
  • Cr Pichard, and Cr Tellier, “Linearization Of Polycrystalline Film Gauge Factors,” Revue De Physique Appliquee, vol. 14, no. 8, pp. 743–747, 1979. View at Publisher · View at Google Scholar
  • F Warkusz, “Grain-Boundary Electron-Scattering In The Total Film Conduction Model,” Thin Solid Films, vol. 62, no. 2, pp. 247–253, 1979. View at Publisher · View at Google Scholar
  • Cr Pichard, Cr Tellier, and Aj Tosser, “3-Dimensional Analytical Expressions Of Strain-Gauge Coefficients Of Infinitely Thick Polycrystalline Metal-Films,” Journal Of Materials Science, vol. 15, no. 12, pp. 2991–2994, 1980. View at Publisher · View at Google Scholar
  • Aj Tosser, Cr Tellier, and Cr Pichard, “Superimposed Effects Of 3 Arrays Of Scattering Planes On Electrical-Conductivity,” Physica Status Solidi B-Basic Research, vol. 99, no. 1, pp. 353–358, 1980. View at Publisher · View at Google Scholar
  • F Warkusz, “Electrical And Mechanical-Properties Of Thin Metal-Films - Size Effects,” Progress In Surface Science, vol. 10, no. 3, pp. 287–382, 1980. View at Publisher · View at Google Scholar
  • Aj Tosser, Cr Tellier, and Cr Pichard, “Thermal Strains In Thin Metallic-Films,” Journal Of Physics D-Applied Physics, vol. 13, no. 7, pp. 1325–1329, 1980. View at Publisher · View at Google Scholar
  • Cr Pichard, Cr Tellier, and Aj Tosser, “3-Dimensional Strain Coefficients Of Resistivity Of Thin Polycrystalline Metal-Films,” Journal Of Materials Science, vol. 16, no. 8, pp. 2281–2286, 1981. View at Publisher · View at Google Scholar
  • Tellier, Pichard, and Tosser, “Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains,” ElectroComponent Science and Technology, vol. 9, no. 2, pp. 125–130, 1981. View at Publisher · View at Google Scholar
  • Pichard, Tosser, and Tellier, “Empirical results establishing the thermal independence of the grain-boundary reflection coefficient,” ElectroComponent Science and Technology, vol. 7, no. 4, pp. 217–220, 1981. View at Publisher · View at Google Scholar
  • C. R. Pichard, A. J. Tosser, and C. R. Tellier, “Thermoelectric power of supported thin polycrystalline films,” Journal of Materials Science, vol. 17, no. 1, pp. 10–16, 1982. View at Publisher · View at Google Scholar
  • C.R. Tellier, and A.J. Tosser, “Size Effects In Mechanical And Electromechanical Properties,” Size Effects in Thin Films, pp. 251–286, 1982. View at Publisher · View at Google Scholar
  • Tellier, “Thin Metal Film Sensors,” Active and Passive Electronic Components, vol. 12, no. 1, pp. 9–32, 1985. View at Publisher · View at Google Scholar