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ElectroComponent Science and Technology
Volume 4 (1977), Issue 1, Pages 23-28

Determination of Dielectric Constant of Stearic Acid Films Using Varying Gap Immersion Method

1Research Institute of Electronics, Shizuoka University, Hamamatsu 432, Japan
2Hamamatsu Hygienic College, Mikatabara, Hamamatsu 433, Japan
3Laboratoire de Physique des Décharges, École Supérieure d'Electricité, GIF-SUR-YVETTE, 91190, France

Received 1 July 1976; Accepted 5 April 1977

Copyright © 1977 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The dielectric constant data (at 3.5 MHz) on stearic acid thin films, obtained by using variable gap immersion method, are presented. Many of the errors of the conventional universal bridge method are eliminated in the method used here. It is also shown that the varying gap immersion method serves as an experimental tool for simultaneous determination of film thickness with high degree of accuracy. The data on evaporated as well as Langmuir films of stearic acid (≥1000 Å) are found to be consistent and in reasonable agreement.