Abstract
A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.
Open Access
A Screening Technique for Establishing the Stability of Metal Film Resistors
Received08 Jan 1977
Accepted15 Jun 1977
Copyright
Copyright © 1978 Hindawi Publishing Corporation. This is an open access article distributed under the
Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.