Abstract
The analysis of electrical conductivity of continuous thin monocrystalline metal film has been treated by assuming that the scattering from other sources than grain-boundaries can be described by an effective relaxation time. This relaxation time method is applied to the temperature coefficient of resistivity and leads to an analytical approximate equation in terms of the grain-boundary reflection coefficient r and the reduced thickness k.Comparison of the results with those deduced from the exact equation (derived from the Mayadas and Shatzkes theory) shows that they deviate by less than 5% in large k–, p–, and r– ranges.