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ElectroComponent Science and Technology
Volume 7, Issue 1-3, Pages 63-67
http://dx.doi.org/10.1155/APEC.7.63

Current Noise of Resin Type and Cermet Type Thick Film Resistors

Shen-Li Fu, Toyotaro Shiramatsu, and Tien-Shou Wu

Department of Electrical Engineering, National Cheng Kung University, Taiwan, Tainan, China

Received 1 June 1979

Copyright © 1980 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity (log⁡ ρS), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed as C.N.I. = A + B log⁡ ρS. The geometrical dependency on C.N.I. in both types of resistor can be expressed as C.N.I. = A′ − B′ log⁡ (L, W, T), where A, B, A′ and B′ are constants. The dependency of noise e.m.f. (νn) on the applied dc voltage (V), i.e., the values of α in νn2¯∝Vα, can be obtained from the slope of C.N.I. versus log⁡ (L) lines, associated with a model based on the noise generator approximation.