Active and Passive Electronic Components

Active and Passive Electronic Components / 1985 / Article

Open Access

Volume 12 |Article ID 26014 | 8 pages | https://doi.org/10.1155/1985/26014

Voltage Degradation Model of Thin Film Capacitors

Received01 Nov 1983
Accepted05 Aug 1984

Abstract

A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its distribution is defined. The experimental data presented conforms with the described model.

Copyright © 1985 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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