T. M. Berlicki, "Voltage Degradation Model of Thin Film Capacitors", Active and Passive Electronic Components, vol. 12, Article ID 026014, 8 pages, 1985. https://doi.org/10.1155/1985/26014
Voltage Degradation Model of Thin Film Capacitors
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its distribution is defined. The experimental data presented conforms with the described model.
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