Voltage Degradation Model of Thin Film Capacitors

Abstract

A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage D_c is a function of working voltage. On the base of this model, the short term breakdown voltage and its distribution is defined. The experimental data presented conforms with the described model.