Barbara Holodnik, Abram Jakubowicz, Marian Lukaszewicz, Wolfgang Hauffe, "Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors", Active and Passive Electronic Components, vol. 12, Article ID 037913, 9 pages, 1986. https://doi.org/10.1155/1986/37913
Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors
Thick Ni-P films have been widely investigated at our Institute. This article tends to visualize by use of various microscopic methods how the growth and sintering of individual conducting grains, results in the formation of nickel dendrites responsible for the metallic character of electrical conduction.
Copyright © 1986 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.