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Active and Passive Electronic Components
Volume 12, Issue 4, Pages 215-221

Low Frequency Noise in Tantalum Capacitors

University of Oxford, Clarendon Laboratory, Parks Road, Oxford OX1 3PU, UK

Copyright © 1987 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 Hz. The noise current was found to have a 1/f power spectrum, and the amplitude varied with the bias voltage with a law in the range 1st to 4th power. There was a large difference in amplitudes between different capacitors of the same type.