Active and Passive Electronic Components

Active and Passive Electronic Components / 1988 / Article

Open Access

Volume 13 |Article ID 67016 | 17 pages | https://doi.org/10.1155/1988/67016

The Effect of Various Factors on the Resistance and TCR of RuO2 Thick Film Resistors—Relation Between the Electrical Properties and Particle Size of Constituents, the Physical Properties of Glass and Firing Temperature

Received02 Sep 1987
Accepted16 Sep 1987

Abstract

Thick film resistors were prepared with different variables, they included various conductive particle sizes, glass particle sizes, glass softening temperatures, thermal expansion coefficients of the glass, mixing ratios of the conductive element and glass, firing temperatures, firing cycles, etc. The relation between these factors and electrical properties of the thick film resistors was studied. As a result, it was found that when a specific glass is chosen, its R-TCR curve, which indicates the relation between resistance and TCR of a thick film resistor, is unconditionally fixed regardless of various preparation factors, and the R-TCR curve can be moved only by changing the thermal expansion coefficient of the glass. In addition, the higher the resistance and the larger the thermal expansion coefficient of glass, the larger the resistance change against the external force.

Copyright © 1988 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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