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Active and Passive Electronic Components
Volume 15, Issue 1, Pages 27-31
http://dx.doi.org/10.1155/1992/51780

Reliability Prediction of Thick Film Hybrid Integrated Circuits

1Technical University Sofia, Department of Electronics Technology, Sofia 1756, Bulgaria
2Plant for Capacitors, Kyustendil 2500, Bulgaria

Received 12 July 1991; Accepted 23 October 1991

Copyright © 1992 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Rumen Pranchov, Veneta Athanassova, Ruslan Georgiev, and Stefan Pomakov, “Reliability Prediction of Thick Film Hybrid Integrated Circuits,” Active and Passive Electronic Components, vol. 15, no. 1, pp. 27-31, 1992. https://doi.org/10.1155/1992/51780.