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Active and Passive Electronic Components
Volume 19 (1996), Issue 3, Pages 139-169

Electrical Characterization of Engineering Materials

Hubbell Incorporated, The Ohio Brass Company, 8711 Wadsworth Road, Wadsworth, Ohio 44281, USA

Received 5 September 1995; Accepted 13 October 1995

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Engineering material systems for smart components and novel device applications require a thorough understanding on the structure-property-processing relationships to optimize their performance. The factors determining performance characteristics of the multi-phase/component heterogeneous polycrystalline hybrid (MPCHPH) systems are not identical to devices based on single-crystal/single-junction (SCSJ) technology. Performing SCSJ-like data-analysis on the MPCHPH systems can lead to confusion in delineating simultaneously operative phenomena when “physical geometrical factors”are used in normalizing the as-measured electrical parameters or electrical quantities. Such an analytical approach can vitiate interpretation when microstructural inhomogeneity plays a key role in determining the electrical path. The advantage of using the as-measured electrical parameters or electrical quantities constituting the “immittance function” is emphasized. The “state of normalization” using physical geometrical factors can only be executed for a specific phenomenon when isolated from the total electrical behavior.