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Active and Passive Electronic Components
Volume 21 (1998), Issue 3, Pages 189-198
http://dx.doi.org/10.1155/1998/69085

Analysis of Hot-Carrier Degradation in Small and Large W/Ln-Channel Transistors

1Département de Génie Electrique, Universuté My Ismaïl-F.S.T., B.P. 509, Errachidia, Morocco
2Laboratoire de Caractérisation des Composants à Semiconducteurs, Université Chouaïb Doukkali, B.P. 20, El Jadida, Morocco

Received 5 February 1998; Accepted 15 April 1998

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

E. Bendada and K. Raïs, “Analysis of Hot-Carrier Degradation in Small and Large W/Ln-Channel Transistors,” Active and Passive Electronic Components, vol. 21, no. 3, pp. 189-198, 1998. doi:10.1155/1998/69085