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Active and Passive Electronic Components
Volume 24, Issue 3, Pages 155-163
http://dx.doi.org/10.1155/2001/53209

Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor

C.E.F., University of Perpignan, 52 av. de Villeneuve, Perpignan F-66860, France

Received 20 April 2001; Accepted 15 May 2001

Copyright © 2001 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

N. Toufik, F. Pélanchon, and P. Mialhe, “Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor,” Active and Passive Electronic Components, vol. 24, no. 3, pp. 155-163, 2001. https://doi.org/10.1155/2001/53209.