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Active and Passive Electronic Components
Volume 23, Issue 4, Pages 185-195
http://dx.doi.org/10.1155/APEC.23.185

VDMOSFET Model Parameter Extraction Based on Electrical and Optical Measurements

Radiation Technology, lnterfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, 2629 JB Delft, The Netherlands

Received 22 August 2000; Accepted 13 September 2000

Copyright © 2001 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

C. -T. Salame, C. Rizk, and G. Jelian, “VDMOSFET Model Parameter Extraction Based on Electrical and Optical Measurements,” Active and Passive Electronic Components, vol. 23, no. 4, pp. 185-195, 2001. https://doi.org/10.1155/APEC.23.185.