Table of Contents Author Guidelines Submit a Manuscript
Active and Passive Electronic Components
Volume 26, Issue 2, Pages 115-127
http://dx.doi.org/10.1080/0882751031000073888

On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs

1Far East College, Department of Electrical Engineering, Optoelectronic Semiconductor Center, Hsin-Shih, Tainan, Taiwan 744, China
2National Cheng Kung University, Department of Electrical Engineering, Tainan, Taiwan 701, China

Received 7 November 2002; Revised 17 November 2002

Copyright © 2002 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

K. F. Yarn, W. C. Chien, and C. S. Wang, “On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs,” Active and Passive Electronic Components, vol. 26, no. 2, pp. 115-127, 2002. https://doi.org/10.1080/0882751031000073888.