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Active and Passive Electronic Components
Volume 2011, Article ID 684954, 6 pages
Research Article

Modeling of Transistor's Tracking Behavior in Compact Models

IBM Semiconductor Research and Development Center, System and Technology Group, Mail Stop 972F, 1000 River Street, Essex Junction, VT 05452, USA

Received 1 October 2010; Accepted 17 November 2010

Academic Editor: Jia Feng

Copyright © 2011 Ning Lu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We present a novel method to model the tracking behavior of semiconductor transistors undergoing across-chip variations in a compact Monte Carlo model for SPICE simulations and show an enablement of simultaneous 𝑁 ( 𝑁 1 ) / 2 tracking relations among 𝑁 transistors on a chip at any poly density, any gate pitch, and any physical location for the first time. At smaller separations, our modeled tracking relation versus physical location reduces to Pelgrom's characterization on device's distance-dependent mismatch. Our method is very compact, since we do not use a matrix or a set of eigen solutions to represent correlations among 𝑁 transistors.