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Active and Passive Electronic Components
Volume 2011, Article ID 684954, 6 pages
http://dx.doi.org/10.1155/2011/684954
Research Article

Modeling of Transistor's Tracking Behavior in Compact Models

IBM Semiconductor Research and Development Center, System and Technology Group, Mail Stop 972F, 1000 River Street, Essex Junction, VT 05452, USA

Received 1 October 2010; Accepted 17 November 2010

Academic Editor: Jia Feng

Copyright © 2011 Ning Lu. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Ning Lu, “Modeling of Distance-Dependent Mismatch and Across-Chip Variations in Semiconductor Devices,” Ieee Transactions on Electron Devices, vol. 61, no. 2, pp. 342–350, 2014. View at Publisher ยท View at Google Scholar