Research Article
Thermal-Aware Test Schedule and TAM Co-Optimization for Three-Dimensional IC
begin | Get an initialize schedule ; | Get an initialize temperature > 0; | Set the temperature threshold ; | Set the decay rate < 1; | while < do | for 1 ≦ ≦ do | next a random selected perturbation of current | value[next] − value[current] | if < 0 then current next | else current next only with probability | ; | end for | end while |
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