Research Article

Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET

Table 1

Geometry of designed FinFET.

SNFinFET parametersValue

Top fin width (nm)1
Bottom fin width (nm)15
Oxide thickness (nm)1
Fin height (nm)10 to 40
Doping concentration (/cm3)1015 to 1018