Journals
Publish with us
Publishing partnerships
About us
Blog
Active and Passive Electronic Components
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Active and Passive Electronic Components
/
2020
/
Article
/
Fig 10
/
Research Article
Design, Simulation, and Experimental Verification of a Destruction Mechanism of Transient Electronic Devices
Figure 10
Appearance of the cracked chip.
