Research Article
Experimental Study of the Influence of the Adsorbate Layer Composition on the Wetting of Different Substrates with Water
Figure 2
XPS survey and detail spectra of a gold-sputtered silicon wafer measured at a detector angle of 90° to the surface, after cleaning three times in a supersonic bath with cyclohexane (CCC sample). Counts per second (CPS) are plotted as function of electron binding energy.
(a) Survey spectrum |
(b) Au4f detail spectrum |
(c) C1s detail spectrum |
(d) O1s detail spectrum |