[Retracted] Research on Microseismic Source Location Method Based on Waveform Characteristics Monitored by Nanomaterial Sensor under the Background of Metal Oxide Polluted Environment

Table 4

Source location results based on target eigenfrequencies.

	Settings	1	3	6	9	12
L = 1 m	Measurements	1.41	3.30	6.52	9.76	13.16
	Error	0.41	0.30	0.52	0.76	1.16
L = 3 m	Measurements	1.38	3.25	6.46	9.71	12.88
	Error	0.38	0.25	0.46	0.71	0.88
L = 5 m	Measurements	1.40	3.28	6.48	9.73	12.94
	Error	0.40	0.28	0.48	0.73	0.94