Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

Figure 8

(a) Misclassification rates of SVM- and ELM-based algorithms for circuits in Figures 6(a), 6(b), and 6(c), when the number of impulse-response samples is 30. (b) Time cost of SVM- and ELM-based algorithms for circuits in Figures 6(a), 6(b), and 6(c), when the number of impulse-response samples is 30.

(a)

(b)