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Computational Intelligence and Neuroscience
Volume 2016, Article ID 7657054, 9 pages
http://dx.doi.org/10.1155/2016/7657054
Research Article

Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM

1School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
2Department of Communication Engineering, Chengdu Technological University, Chengdu 611731, China

Received 21 May 2016; Revised 18 July 2016; Accepted 28 July 2016

Academic Editor: Rodolfo Zunino

Copyright © 2016 Jian Xiong et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jian Xiong, Shulin Tian, and Chenglin Yang, “Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM,” Computational Intelligence and Neuroscience, vol. 2016, Article ID 7657054, 9 pages, 2016. https://doi.org/10.1155/2016/7657054.