Research Article
Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM
Table 5
Comparison of time cost and test accuracy between ELM-based method and SVM-based method for the Sallen-Key bandpass filter.
| Feature extraction method | Time (s)/accuracy (%) | SVM classifier | ELM classifier |
| Wavelet coefficients [3] | 11.2/93.1 | 0.0289/88.8 | Kurtosis and entropy [11] | 7.1/98.6 | 0.0213/97.9 | Lifting wavelet [18] | 14.6/99.2 | 0.0350/99.3 | Proposed method | 9.3/99.8 | 0.0275/99.4 |
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