Research Article

Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM

Table 5

Comparison of time cost and test accuracy between ELM-based method and SVM-based method for the Sallen-Key bandpass filter.

Feature extraction methodTime (s)/accuracy (%)
SVM classifierELM classifier

Wavelet coefficients [3]11.2/93.10.0289/88.8
Kurtosis and entropy [11]7.1/98.60.0213/97.9
Lifting wavelet [18]14.6/99.20.0350/99.3
Proposed method9.3/99.80.0275/99.4