[Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network

<div>The classification results of the test set based on ELM. (a) ELM-based test set classification total results. (b) ELM-based test set classification display. (c) Corresponding results of test set classification based on ELM.</div>

Computational Intelligence and Neuroscience

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Figure 5

Figure 5: [Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network 

Figure 5 | [Retracted] Potential Fault Diagnosis Method and Classification Accuracy Detection of IGBT Device Based on Improved Single Hidden Layer Feedforward Neural Network 