Analysis of a No Equilibrium Linear Resistive-Capacitive-Inductance Shunted Junction Model, Dynamics, Synchronization, and Application to Digital Cryptography in Its Fractional-Order Form

<div>Synchronization errors between the drive and response systems (<a href="https://static.hindawi.com/articles/complexity/volume-2017/4107358/figures/#EEq6">8</a>) and (<a href="https://static.hindawi.com/articles/complexity/volume-2017/4107358/figures/#EEq7a">10a</a>)–(<a href="https://static.hindawi.com/articles/complexity/volume-2017/4107358/figures/#EEq7a">10c</a>). The parameters are given in the text.</div>

Complexity

fig11

Figure 11

Figure 11: Analysis of a No Equilibrium Linear Resistive-Capacitive-Inductance Shunted Junction Model, Dynamics, Synchronization, and Application to Digital Cryptography in Its Fractional-Order Form 

Figure 11 | Analysis of a No Equilibrium Linear Resistive-Capacitive-Inductance Shunted Junction Model, Dynamics, Synchronization, and Application to Digital Cryptography in Its Fractional-Order Form 