An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO

<table class="table-group" id="tab1"><tr><td><table class="table"><tr><td class="thead-hr" colspan="2"><hr/></td></tr><tr class="thead"><td class="align_left">Indicator </td><td class="align_center"> Minimum </td></tr><tr><td class="thead-hr" colspan="2"><hr/></td></tr><tr><td class="align_left">FDR</td><td class="align_center"> 95%</td></tr><tr><td class="align_left">FIR with an ambiguity degree of 1</td><td class="align_center"> 95%</td></tr><tr><td class="align_left">FIR with an ambiguity degree of 2</td><td class="align_center"> 98%</td></tr><tr><td class="align_left">FIR with an ambiguity degree of 3</td><td class="align_center"> 99%</td></tr><tr class="table-tr"><td colspan="2"><hr class="tbody-hr"/></td></tr></table></td></tr></table>

The testability indicators for the superheterodyne receiver.

Complexity

tab1

Table 1

Table 1: An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO 