An Improved EMD-Based Dissimilarity Metric for Unsupervised Linear Subspace Learning

Figure 13

The recognition rates on sub, noise, geometric distortion, slight translation, and slight rotation Extended Yale B face databases over “F1” and “F2” features.

(a) Sub

(b) Noise

(c) Barrel distortion

(d) Complex geometric distortion

(e) Pincushion distortion

(f) Slight translation

(g) Slight rotation