Automatic Diagnosis of Microgrid Networks’ Power Device Faults Based on Stacked Denoising Autoencoders and Adaptive Affinity Propagation Clustering

Figure 13

The 3-dimensional results of different datasets for the testing dataset through eight hidden layers by using an SAE with PCA dimension reduction; 1–8 denote the hidden layer number. (a) SAE-A-512-testing data. (b) SAE-B-512-testing data. (c) SAE-A-256-testing data. (d) SAE-B-256-testing data. (e) SAE-A-128-testing data. (f) SAE-B-128-testing data. (g) SAE-A-64-testing data. (h) SAE-B-64-testing data. (i) SAE-A-32-testing data. (j) SAE-B-32-testing data. (k) SAE-A-16-testing data. (l) SAE-B-16-testing data. (m) SAE-A-8-testing data. (n) SAE-B-8-testing data. (o) SAE-A-3-testing data. (p) SAE-B-3-testing data.

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