Automatic Diagnosis of Microgrid Networks’ Power Device Faults Based on Stacked Denoising Autoencoders and Adaptive Affinity Propagation Clustering

Figure 14

The 3-dimensional results of different datasets for the testing dataset through eight hidden layers by using an SDAE with PCA dimension reduction; 1–8 denote the hidden layer number. (a) SDAE-A-512-testing data. (b) SDAE-B-512-testing data. (c) SDAE-A-256-testing data. (d) SDAE-B-256-testing data. (e) SDAE-A-128-testing data. (f) SDAE-B-128-testing data. (g) SDAE-A-64-testing data. (h) SDAE-B-64-testing data. (i) SDAE-A-32-testing data. (j) SDAE-B-32-testing data. (k) SDAE-A-16-testing data. (l) SDAE-B-16-testing data. (m) SDAE-A-8-testing data. (n) SDAE-B-8-testing data. (o) SDAE-A-3-testing data. (p) SDAE-B-3-testing data.

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