A Novel THz Differential Spectral Clustering Recognition Method Based on t-SNE

Figure 6

Clustering results of monocrystalline silicon with zero defects: (a) optical image; (b) THz image; (c) 8000/1000/100; (d) 12000/1000/100; (e) 10000/5000/100; (f) 12000/5000/100. Description format: sampled data/iterations/perplexity.

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