Research Article

Genetic Variability and Its Implications on Early Generation Sorghum Lines Selection for Yield, Yield Contributing Traits, and Resistance to Sorghum Midge

Table 9

Genetic variation for resistance to midge, yield, and yield contributing characters in the first planting date at Konni.

TraitsGMGVPVPCV (%)GCV (%) (%)GA (% mean)

GY479174818385659.0926.9820.8424.90
PH243.41811.452459.3520.3717.4873.6530.63
PW71.7404.11047.745.1428.0338.5735.33
FF71.257.8587.6213.133.938.9521.65
TSW18.32.8592.4552.549.223.0831.25
MD0.370.030.1086.9452.6436.6664.47

GY: grain yield; PH: plant height; PW: panicle weight; FF: days to 50% flowering; TSW: 1000 seeds weight; MD: midge damage; GM: grand mean; GV: genotypic variance; PV: phenotypic variance; GCV: genotypic coefficient of variance; PCV: phenotypic coefficient of variance; : broad sense heritability; GA: genetic advance as a percentage of mean.