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International Journal of Antennas and Propagation
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International Journal of Antennas and Propagation
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2012
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Article
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Tab 1
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Research Article
Full-Wave Analysis of Traveling-Wave Field-Effect Transistors Using Finite-Difference Time-Domain Method
Table 1
Line parameters of test TWFET.
0.10 pF/mm
0.73 nH/mm
0.17 pF/mm
0.70 nH/mm
0.09 pF/mm
0.42 nH/mm