498767.fig.002a
(a)
498767.fig.002b
(b)
498767.fig.002c
(c)
Figure 2: Equipment and setup for the measurement of dielectric properties of the two samples. (a) Cylindrical, open-ended, and coaxial probe [26]. (b) Load for the calibration of the open-ended probe [26]. (c) Schematics of the experimental setup, showing field infringement at the open end of the probe due to abrupt change in impedance.