Research Article

A Novel Inversion Method of Manufacturing Flaws in the Packaging of Conformal Load-Bearing Antenna Structure

Table 3

Influence of flaw’s location on the far field pattern.

LocationBeam squint (°)Raise of left SLL (dB)Raise of right SLL (dB)

Node 1−0.1−0.09−0.08
Node 20−0.060.09
Node 300.140.13
Node 4−0.20.490.41
Node 500−0.03
Node 600.060.06