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International Journal of Antennas and Propagation
Volume 2017, Article ID 7852135, 7 pages
Research Article

A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components

School of Electronic Engineering, University of Electronic Science and Technology of China, No. 2006, Xiyuan Road, West Hi-Tech Zone, Chengdu 611731, China

Correspondence should be addressed to Xin Cao; moc.qq@957998897

Received 18 February 2017; Accepted 27 April 2017; Published 14 May 2017

Academic Editor: N. Nasimuddin

Copyright © 2017 Xin Cao and Zongxi Tang. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measurement standards and fixture are designed based on these two calibration methods. For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured. The parasitic effects of the SMD capacitors are analyzed. The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components.