Printable Materials for the Realization of High Performance RF Components: Challenges and Opportunities

Table 4

Thin film microstructure analysis.

Characterization methods	AFM	XRD	Optical profilometer	SEM & TEM	Nanoindentation
Figures of merit	Surface roughness, line shape	Lattice parameter, crystal structure, phase analysis, residual stress, preferred orientation	Line shape, line widths, line thickness	Grain size, grain orientation, crystal defects, voids	Hardness, fracture toughness