Research Article

Characteristics of 2 Different Commercially Available Implants with or without Nanotopography

Table 2

Surface roughness measurement using the AFM (scan size 10 × 10).

Scan size 10 × 10Sa µm (SD)Sdr % (SD)Sds 1/µm2 (SD)

P-I MICRO+NANO0.051 (0.007)8.49 (3.59)9.59555 (5.20)
OSPOL0.058 (0.005)11.44 (1.27)3.08 (0.30)