Research Article
Characteristics of 2 Different Commercially Available Implants with or without Nanotopography
Table 3
Surface roughness measurement using the AFM (scan size 1 × 1).
| | Scan size 1 × 1 | Sa nm (SD) | Sdr % (SD) | Sds 1/µm2 (SD) |
| | P-I MICRO+NANO | 4.35 (1.36) | 8.56 (7) | 1533 (671) | | OSPOL | 5.18 (1.11) | 8.9 (3.70) | 2295.2 (734) |
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