International Journal of Dentistry / 2013 / Article / Tab 3

Research Article

Characteristics of 2 Different Commercially Available Implants with or without Nanotopography

Table 3

Surface roughness measurement using the AFM (scan size 1 × 1).

Scan size 1 × 1Sa nm (SD)Sdr % (SD)Sds 1/µm2 (SD)

P-I MICRO+NANO4.35 (1.36)8.56 (7)1533 (671)
OSPOL5.18 (1.11)8.9 (3.70)2295.2 (734)

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