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Figure 3: TEM sample preparation of a SIT 12-week bone-implant interface using FIB. (a) Selection of ROI. (b) Deposition of protective carbon layer over ROI. (c) Rough milling of the material surrounding the ROI. (d) Lift-out of the lamella containing the ROI via an in situ micromanipulator. (e) Attachment of the lamella on the copper TEM grid (arrow indicates sample location). (f) Cross-sectional view of the electron transparent sample following final thinning.