Table of Contents
International Journal of Microwave Science and Technology
Volume 2012, Article ID 132136, 2 pages

Microwave and Millimeter-Wave Sensors, Systems, and Techniques for Electromagnetic Imaging and Materials Characterization

1Applied Electromagnetics Group, Department of Naval, Electrical, Electronic, and Telecommunication Engineering, University of Genoa, 16145 Genoa, Italy
2Applied Microwave Nondestructive Testing Laboratory (amntl), Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO 65409, USA
3Department of Quality, Anritsu Company, Morgan Hill, CA 95037, USA

Received 24 October 2012; Accepted 24 October 2012

Copyright © 2012 Andrea Randazzo et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This article has no abstract.