Review Article
Research Progress of Stress Measurement Technologies for Optical Elements
Table 1
Comparison between different methods.
| Method | Key equipment | Advantage | Disadvantage | Stress precision |
| DP | Polarization camera, image sensor | Automatic, high resolution | Complexity, Inflexibility | 184 kPa (4 nm/cm) | PEM | Photoelastic modulator | High sensitivity, high speed, good stability | Limited measurement range | 0.2 kPa (0.008 nm/cm) | LDV | Laser Doppler vibrometer | High sensitivity, good visualization, good stability | Inability to detect the shear wave directly | 0.036 Pa | LSI | Laser self-mixing interferometer | Simple, low cost, wide range | Limited measurement accuracy | 0.152 nm/cm | LFI | Laser feedback interferometer | Simple, low cost | Limited measurement accuracy | 19 nm/cm | CRD | Light source, optical resonator | High sensitivity, wide range | Low engineering applicability | 0.03 kPa (12 × 10−4 nm/cm) |
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