Research Article

Analysis of the Spatial-Frequency Characteristics of the Photo-Assisted Method of a Quartz Rough Surface Nano-Polishing

Figure 3

Contrast of the evanescent field over the sinusoidal quartz surface profile depending on the spatial frequency of the profile at different heights of the protrusions : 5 nm (curve 1), 50 nm (curve 2), and 150 nm (curve 3).