Research Article
Analysis of the Spatial-Frequency Characteristics of the Photo-Assisted Method of a Quartz Rough Surface Nano-Polishing
Figure 6
Contrast of the evanescent field over irregularities of a random surface profile with a Gaussian correlation function, depending on the spatial frequency of this profile for cases when the profile correlation lengths correspond to nm (curves 1, 4, and 7), nm (curves 2, 5, and 8), and nm (curves 3, 6, and 9), and the standard deviation of the profile height corresponds to nm (curves 1, 2, and 3), nm (curves 4, 5, and 6), and nm (curves 7, 8, and 9).