Research Article

Analysis of the Spatial-Frequency Characteristics of the Photo-Assisted Method of a Quartz Rough Surface Nano-Polishing

Figure 6

Contrast of the evanescent field over irregularities of a random surface profile with a Gaussian correlation function, depending on the spatial frequency of this profile for cases when the profile correlation lengths correspond to  nm (curves 1, 4, and 7),  nm (curves 2, 5, and 8), and  nm (curves 3, 6, and 9), and the standard deviation of the profile height corresponds to  nm (curves 1, 2, and 3),  nm (curves 4, 5, and 6), and  nm (curves 7, 8, and 9).